TTEP 2009 - Call for Tutorial Proposals

Submission Deadline November 16th, 2008!

CALL FOR TUTORIAL PROPOSALS

Overview -- Author Information -- Tutorials and Education Group

Overview

The Tutorials & Education Group (TEG) of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2009 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. The objective of this common call is to invite submissions for tutorial proposals in order to enable selecting the best fitted tutorials for each technical meeting, as part of the annual Test Technology Educational Program (TTEP).

The tutorials accepted by the Program Committee will be included in the Test Technology Educational Program, the intent of which is to serve the test and design professionals offering fundamental education and expert knowledge in state-of-the-art test technology topics.

Participation in TTEP-organized tutorials is credited by IEEE Computer Society. Each full day tutorial corresponds to four TTEP units (half day tutorial corresponds to two TTEP units). Upon completion of each sixteen units official accreditation in the form of the “IEEE TTTC Test Technology Certificate” is presented to the participants.

The TTEP 2009 tutorials program includes (but is not limited to) the following technical meetings:

Latin American Test Workshop (LATW’09), March 2–5, Buzios, Rio de Janeiro, Brazil
Design, Automation & Test in Europe Conference (DATE’09), April 20–24, Nice, France
VLSI Test Symposium (VTS’09), May 3–7, Santa Cruz, California, USA
Signal Propagation on Interconnects Workshop (SPI’09), May 12–15, Strasbourg, France
European Test Symposium (ETS’09), May 25–29, Sevilla, Spain
International On-Line Testing Symposium (IOLTS’09), June 24–27, Lisbon, Portugal
International Test Conference (ITC’09), November 2–6, Austin, Texas, USA
Asian Test Symposium (ATS’09), November 23–26, Taichung, Taiwan

TTEP accommodates a wide range of technical areas, from mature test topics of high interest to industrial test engineers to emerging test topics with emphasis on novelty. TTEP is soliciting new and updated tutorial proposals and the topics of interest for year 2009 TTEP Tutorials include (but are not limited to):

Automatic test equipment
Board-level testing
Built-In Self-Test
Defect oriented testing
Design for testability
DFT testers
Diagnosis and debug
Embedded core testing
High-speed interface testing
Interconnect characterization
Memory testing
Mixed-Signal/Analog testing
Nanometer techn. testing
On-line and field testing
Performance/Delay testing
Power issues in testing
System-level testing
Test economics
Test synthesis
Test resource partitioning
Validation
Verification
Wafer testing
Yield optimization and test

Author Information

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All tutorial proposal submissions to TTEP 2009 are to be made electronically (in PDF format using the TTEP tutorial proposal template provided on both the TTEP main web site and the submission website) through the TTEP submissions website:

http://www.molesystems.com/welcome/tttc/TTEP/2009/loginttep.php

Deadlines and key dates:

October 8, 2008: Deadline for tutorial proposals for DATE09.
November 16, 2008: Deadline for tutorial proposals for all other TTEP09 events.
November 12, 2008: Notification of acceptance for DATE09.
February 25, 2009: Notification of acceptance for the other TTEP09 events.

Contact Information:

Dimitris Gizopoulos
TTEP Chair
University of Piraeus, Greece
T: +30 210 414 2372
F: +30 210 414 2264
E: dgizop@unipi.gr

Anand Raghunathan
TTEP Vice Chair
Perdue University, USA
T: +1 765 494 3470
F: +1 765 494 3358
E: raghunathan@purdue.edu

Kaushik Roy
TTEP Vice Chair
Purdue University, USA
T: +1 765 494-2361
F: +1 765 494-3371
E: kaushik@ecn.purdue.edu

TTEP central web site:http://tab.computer.org/tttc/teg/ttep

TTEP submissions web site: http://www.molesystems.com/welcome/tttc/TTEP/2009/loginttep.php

Tutorials and Education Group

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Tutorials and Education Group Chair
Dimitris Gizopoulos
University of Piraeus

Vice Chair (Organization)
Anand Raghunathan
Perdue University

Vice Chair (Program)
Kaushik Roy
Purdue University

Finance
M. Nicolaidis, TIMA Laboratory

Publicity
C. Metra, University of Bologna
Y. Makris, Yale University

Planning
V. Agrawal, Auburn University
G. Robinson

Industry Relations
R. Aitken, ARM

New Topics
B. Courtois, TIMA Laboratory
M. Hsiao, Virginia Tech.

Audio/Visual
S. Menon, Intel

Electronic Media
G. Xenoulis, U. of Piraeus
S. Di Carlo, Poli. di Torino
G. Di Natale, LIRMM

Program Committee
T.Aikyo, STARC
R.Aitken, ARM
D.Appello, ST Microelectronics
U.Arz, PTB
S.Bhunia, Case West. U.
K.Butler, Texas Instruments
S.Chakravarty, LSI Logic
V.Champac, INAOE
S.Davidson, Sun
B.Eklow, CISCO
A.Gattiker, IBM
P.Girard, LIRMM
P.Harrod, ARM
K.Hatayama, STARC
D.Josephson, Intel
J.-J.Liou, Nat. Tsing Hua U.
T.M.Mak, Intel
H.Manhaeve, Q-Star
A.Osseiran, Edith Cowan U.
A.Paschalis, U. of Athens
B.Paul, Toshiba
A.Raghunathan, Purdue U.
M.Renovell, LIRMM
M.Slamani, IBM
S.Sunter, LogicVision
A.Yakovlev, U. Newcastle

For more information, visit us on the web at: http://tab.computer.org/tttc/teg/ttep

The Test Technology Educational Program 2009 (TTEP 2009) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	TTEP 2009 TEST TECHNOLOGY EDUCATIONAL PROGRAM 2009 http://tab.computer.org/tttc/teg/ttep